Environmental Scanning Electron Microscope

Purpose 

Characterize near-crack-tip damage mechanisms in metallic and metal-matrix composite materials. Perform mechanical testing within microscope chamber to allow in-situ observation of the progression of near crack tip. The lab uses SEM-based digital image correlation and other analysis tools to characterize material damage state.
Equipment/Test Method
Scanning Electron Microscope
Scanning electron microscope able
to operate at partial pressures of
various gases

leading edgews

Electron back-scatter diffraction
(EBSD); allows determination of
crystallographic orientation
of surface grains.

ESEM screw driven loading stage

Screw-driven loading stage;

allows loading and heating of small

mechanical test specimens.  

SEM Based Digital image

SEM-based digital image correlation

system; unlike other systems,

nanometer-sized deformations

can be resolved.

Typical/Recent Experiments 

  • A Replica-based crack inspection method was developed using this equipment. Here, replicas were made of small cracks in Space Shuttle Main Engine flight hardware. Cracks as small as 100 m were able to be resolved with great reliability, representing a 15-fold improvement in the state-of-the-art crack detection method used on Space Shuttle flight hardware.
  • Fatigue crack growth and fracture testing on sensory materials. Here, the nanometer-scale digital image correlation system was able to resolve displacements within shape-memory particles showing the strain required to produce a detectable phase transformation.